Electron microscopy determination of crystallographic polarity of aluminum nitride thin films

Kuwano, N. and Kaur, Jesbains * (2017) Electron microscopy determination of crystallographic polarity of aluminum nitride thin films. In: Regional Conference on Materials & ASEAN Microscopy Conference 2017 (RCM & AMC 2017), 12-13 December 2017, USM, Penang.

[img]
Preview
Text
Jesbains Electron Microscopy.pdf

Download (296kB) | Preview
Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: electron microscopy; crystallographic polarity; wurtzite structure
Subjects: Q Science > QC Physics
Divisions: Sunway University > School of Science and Technology > Research Centre for Nano-Materials and Energy Technology
Depositing User: Dr Janaki Sinnasamy
Date Deposited: 01 Sep 2018 05:19
Last Modified: 01 Sep 2018 05:19
URI: http://eprints.sunway.edu.my/id/eprint/894

Actions (login required)

View Item View Item